IXS 2010

The IXS2010 conference will bring together researchers from all over the world working in the field of inelastic X-ray scattering. It is intended to provide a forum for the presentation of novel results, discussion on present and future trends and for an intense exchange between participants utilising the various IXS techniques for a wide variety of different applications.

The conference will cover electronic resonant and non-resonant scattering (in the soft- and hard x-ray regime), emission spectroscopy, meV-resolved atomic dynamics, nuclear inelastic scattering, Compton scattering, and thermal diffuse scattering.

Presentations will consist of invited and contributed talks and two poster sessions. The schedule will allow ample time for informal discussions.

The scientific part of the conference is followed by organised tours to explore the Grenoble area on Friday.